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个人信息Personal Information
工程师
性别:男
毕业院校:中科院研究生院
学位:博士
所在单位:软件学院、国际信息与软件学院
电子邮箱:xinyangao@dlut.edu.cn
扫描关注
- [1]Liu, Wenbo, Zhou, Ning, Gao, Xinyan.L-Code: An Efficient Coding Scheme for Recovering Single Disk Failure[A],2018,108-111
- [2]周宁, 高新岩, 何安平.A high precision and realtime physics-based hand interaction for virtual instrument[A],2018,902(4):552-563
- [3]Li Z., Zhang Q., Ren H., Liu W., Gao X., Li, Z., School of Information Engineering, Communication University of ChinaChina, email: lizhen@cuc.edu.cn.An efficient QoS enhancement mechanism of VoIP using erasure array codes[J],High Technology Letters,2017,23(4):390-398
- [4]He A., Han X., Duan T., Zhou N., Liu R., Gao X., Wu H., Gao, X., G&S Labs, School of Software, Dalian University of TechnologyChina, email: GSLabs@126.com.Fast fingerprint recognition solution based on neuron chip engine[J],Journal of Information and Computational Science,2015,12(18):6685-6692
- [5]Jia Q., Gao X., Luo Z., Fan X., Guo H., Fan, X., School of Software Technology, Dalian University of TechnologyChina.Feature points matching based on geometric constraints[J],Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics,2015,27(8):1389-1398
- [6]Liang Y., Zhuo L., Chen N., Cheng C., Li R., Gao X., Gao, X., G, S Labs, School of Software, Dalian University of TechnologyChina.Hardware based high efficient recognition of 3D hand gestures[J],Journal of Fiber Bioengineering and Informatics,2015,8(2):337-345
- [7]迟宗正, 于成, 高新岩, 刘, 李大奎.软件学院电子技术综合实验教学体系建设[J],计算机教育,2014,17:28-31
- [8]Zhou, Ning, Gao, Xinyan, Wu, Jinzhao, Wei, Jianchao, Li, Dakui, JZ (reprint author), Beijing Jiaotong Univ, Sch Comp & Informat Technol, Beijing 10044, Peoples R China..Groebner Bases Based Verification Solution for SystemVerilog Concurrent Assertions[J],JOURNAL OF APPLIED MATHEMATICS,2014
- [9]Gao, Xinyan, Ding, Yingcai, Liu, Wenbo, Zheng, Kaidi, Huang, Siyu, Zhou, Ning, Li, Dakui, DK (reprint author), Beijing Jiaotong Univ, Sch Comp & Informat Technol, Beijing 100044, Peoples R China..Unified Mathematical Framework for Slicing and Symmetry Reduction over Event Structures[J],JOURNAL OF APPLIED MATHEMATICS,2014
- [10]Gao X., Li D., Zhou N., Li, D., School of Software of Dalian University of Technology, Dalian 116620, China, email: ldk@dl.cn.Wu's method based temporal assertions checking for SEREs properties[J],Journal of Information and Computational Science,2013,10(3):901-910
- [11]高新岩.Wus Characteristic Set Method for SystemVerilog Assertions Verification[J],J. Applied Mathematics,2013,1:1-14
- [12]高新岩.Slicing reduction for algebraic verification of SEREs properties[A],2013,792-795
- [13]高新岩, 李大奎.Wus Method Based Temporal Assertions Checking for SEREs Properties[J],Journal of Information & Computational Science,2013,3(10):901-910
- [14]Zhou, Ning, Wu, Jinzhao, Gao, Xinyan, JZ (reprint author), Beijing Jiaotong Univ, Sch Comp & Informat Technol, Beijing 10044, Peoples R China..Algebraic Verification Method for SEREs Properties via Groebner Bases Approaches[J],JOURNAL OF APPLIED MATHEMATICS,2013,2013
- [15]Hu, Lizhong, Zhou, Ning, Gao, Xinyan.Algebraic Verification Platform Design Based on Shell Engine[A],2013,38:940-943
- [16]Zhou N., Gao X., Wu J., Wu, J., Guangxi Key Laboratory of Hybrid Computation, IC Design Analysis, Guangxi University for Nationalities, Nanning, China, email: jzwu_zh@yahoo.cn.Applying wu's method to symbolic simulation for boolean layer PSL assertion checking[J],Journal of Convergence Information Technology,2012,7(4):271-279
- [17]高新岩.Applying Wus Method to Symbolic Simulation for Boolean Layer PSL Assertion Checking[J],Journal of Convergence Information Technology,2012,7(4):272-279
- [18]Gao, Xinyan, Luo, Xianlu, Li, Dakui, Zhou, Ning.A Case Study on High Trustworthy Environment Construction for Smart Home Applications[A],2011,143:755-+
- [19]Gao X., Zhou N., Li F., Li D..Combining symbolic simulation and Groebner bases approach for constrained PSL property verificati...[A],2011,136 LNEE:377-384
- [20]高新岩, 李大奎.Embedded microscope vision based mechanical platform for led wafer automatic inspection[A],2011,2(LENN133):309-316